Quantitative characterization of the semiconducting fraction in single-walled carbon nanotube samples

Quantitative characterization of the semiconducting fraction in single-walled carbon nanotube samples

Conference

Abstract

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Details

PUBLISHED IN
MRS Fall Meeting, Boston, MA
PUBLICATION DATE
01 jún. 2008
AUTHORS
A. Naumov, O. Kuznetsov, A. Green, M. Hersam, A. Harutyunyan, R. Weisman