Quantitative characterization of the semiconducting fraction in single-walled carbon nanotube samples - Quantitative characterization of the semiconducting fraction in single-walled carbon nanotube samples - HRI-US

Quantitative characterization of the semiconducting fraction in single-walled carbon nanotube samples

Quantitative characterization of the semiconducting fraction in single-walled carbon nanotube samples

Conference

Abstract

Details

PUBLISHED IN

MRS Fall Meeting, Boston, MA

PUBLICATION DATE

01 Jun 2008

AUTHORS

A. Naumov, O. Kuznetsov, A. Green, M. Hersam, A. Harutyunyan, R. Weisman